Industry Standard Unbiased Roughness Measurements

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MetroLER provides the most accurate pattern roughness measurements available. (Investigation and all SEM images in collaboration with imec)

MetroLER provides the most accurate pattern roughness measurements available. (Investigation and all SEM images in collaboration with imec)

Pattern roughness is one of the most pressing issues for leading edge semiconductor manufacturing since it can significantly decrease yield and increase cost.

Traditional methods of measuring roughness are inaccurate, inconsistent, and mostly inadequate for current manufacturing technologies.  

Since you cannot fix what you cannot measure, we created MetroLER -- the most accurate software tool for measuring roughness. 

If you are not using MetroLER, you should not trust your roughness measurement results.