Pattern roughness is one of the most pressing issues for leading edge semiconductor manufacturing since it can significantly decrease yield and increase cost.
In the past, solving pattern roughness was more of an art than a science. Fractilia was formed to change that.
Since you cannot fix what you cannot measure, we created MetroLER -- the most accurate software tool for measuring roughness.
If you are not using MetroLER, then you cannot trust your roughness measurement results.