Papers and events of interest at 2019 SPIE Advanced Lithography: Download
January 10, 2019: Fractilia releases MetroLER version 1.8.0 with new analysis capabilities along with significantly enhanced usability. Contact Fractilia for more information.
November 16, 2018: Fractilia releases MetroLER version 1.7.7 with even greater accuracy, faster execution speed and new feature analysis capabilities. Contact Fractilia for more information.
SPIE Newsroom video: Chris Mack -- Stochastics and the phenomenon of line-edge roughness